Validation Techniques for Fault Emulation of SRAM-based FPGAs

Author H. Quinn; M. Wirthlin
Abstract A variety of fault emulation systems have been created to study the effect of single-event effects (SEEs) in static random access memory (SRAM) based field-programmable gate arrays (FPGAs). These systems are useful for augmenting radiation-hardness assurance (RHA) methodologies for verifying the effectiveness for mitigation techniques; understanding error signatures and failure modes in FPGAs; and failure rate estimation. For radiation effects researchers, it is important that these systems properly emulate how SEEs manifest in FPGAs. If the fault emulation systems does not mimic the radiation environment, the system will generate erroneous data and incorrect predictions of behavior of the FPGA in a radiation environment. Validation determines whether the emulated faults are reasonable analogs to the radiation-induced faults. In this paper we present methods for validating fault emulation systems and provide several examples of validated FPGA fault emulation systems.
Publication IEEE Transactions on Nuclear Science
Volume 62
Issue 4
Pages 1487-1500
Date 2015
DOI 10.1109/TNS.2015.2456101
ISSN 0018-9499;00189499


Circuit faults;Emulation;Field programmable gate arrays;Hardware;Pins;Software;Testing